GE Phoenix nanome|x / microme|x DXR Operating Manual
phoenix microme|x / nanome|x
High resolution 180 kV micro- / nanofocus X-ray
inspection systems with 3D CT option
Brilliant high dynamic imaging with liv
e CAD data ov
erlay
Open BGA ball with live
CAD data overlay and
Flash! FiltersTM image
optimization
3D Computed Tomogra-
phy of an USB flash drive
Automated PTH solder
joint inspection with live
CAD data overlay and
Flash! FiltersTM image
optimization
Unique features
• Temperature stabilized digital DXR detector with
active cooling for high dynamic live imaging
• 180 kV / 20 W high-power micro- /nanofocus
tube with up to 0.5 µm or 0.2 µm detail
detectability
• x|act package for CAD based µAXI program-
ming and automatic inspection
• diamond|window for up to 2 times faster data
acquisition at the same high image quality level
• Optionally 3D computed tomography scans
within 10 seconds
GE
Measurement & Control
Also See for GE Phoenix nanome|x / microme|x DXR
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