GE Phoenix nanome|x / microme|x DXR Operating Manual

GE Microfocus and Nanofocus Operating Manual - Phoenix nanome|x / microme|x DXR.
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phoenix microme|x / nanome|x

High resolution 180 kV micro- / nanofocus X-ray 

inspection systems with 3D CT option

       

                                          Brilliant high dynamic imaging with liv

e CAD data ov

erlay

Open BGA ball with live 
CAD data overlay and 
Flash! FiltersTM image 
optimization

3D Computed Tomogra-
phy of an USB flash drive

Automated PTH solder 
joint inspection with live 
CAD data overlay and 
Flash! FiltersTM image 
optimization

Unique features
• Temperature stabilized digital DXR detector with 

active cooling for high dynamic live imaging

• 180 kV / 20 W high-power micro- /nanofocus 

tube with up to 0.5 µm or 0.2 µm detail 

detectability

• x|act package for CAD based µAXI program-

ming and automatic inspection

• diamond|window for up to 2 times faster data 

acquisition at the same high image quality level 

• Optionally 3D computed tomography scans 

within 10 seconds

GE

Measurement & Control

0.556975s